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Kratos X-ray Photoelectron Spectrometer - Axis Ultra DLD
Information the Equipment Can Provide
This multi-technique with photoelectron and ion spectroscopies, including surface-mapping capabilities, was purchased from Kratos Analytical in 2007 to determine surface elemental and composition analysis. Most samples can be analyzed in a non-invasive or non-destructive method. This instrument is equipped with additional techniques:
- X-ray photoelectron spectroscopy (XPS) provides information on elemental composition and chemical bonding states of materials
- Ultraviolet photoelectron spectroscopy (UPS) provides information on valence levels and work function measurements of materials
- Low energy Ion Scattering spectroscopy (ISS) provides provide evaluation of the elemental composition and structure of solid surfaces
- XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface
Key Features
- Signal detected: Photoelectron from near surface atoms
- Elements detected: From Lithium to heavy metals
- Detection limits: 0.1 to 1 atomic %.
- Depth resolution: 2 to 8 nm
- Depth Profile: 0.5 nm/second using Argon ions
- Lateral resolution: 15 to 500 microns
The Kratos XPS is also equipped with a set of chambers and a capsule (collectively called ROX interface) to transfer air sensitive samples from an argon (or nitrogen) filled glove box to the XPS surface analysis chamber, which is under ultra-high vacuum (UHV). The Rox Interface was designed and developed at the Texas Materials Institute (U.S. Patent Application Serial No. 14/445,650 filed July 29, 2014). Unlike commercial interfaces, the Rox interface was designed with a unique innovation, as it has a built-in semi-quantitative method to monitor sample transfer reliability and validity.
Fees and Policies
- UT Users: $60/hour
- Higher Education/State Agencies: $212/hour
- Corporate/External Users: $293/hour
To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.
HF Hood
Information the Equipment Can Provide
Hydrofluoric acid is a clear, colorless liquid which is an extremely dangerous material in all forms, including vapors and solutions.
Chemicals approved for use in the TMI’s cleanroom HF hood:
- Buffered oxide etchant (BOE), Buffer HF improved, solution UN2817, Transcene (mixture of ammonium hydrogen difluoride, hydrofluoric acid and water)
- Hydrofluoric acid (48 wt. %), 7667-39-3
Usage of any other mixtures with HF will have to be approved by the facility manager.
Supporting Documents:
Fees and Policies
Cleanroom Entry fee:
- UT Users: $6
- Higher Education/State Agencies: $10
- Corporate/External Users: $10
There are no fees associated with using the HF Hood, except the cleanroom entry fee.
Do not attempt to use the HF hood without prior training.
Hydrofluoric acid-based processes can be performed only between 8:00 AM to 5:00 PM, Monday through Friday.
Always work in pairs, reserve the HF hood in FBS and start timer.
To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.
To become a user of this instrument you must first complete the Cleanroom Safety Class. Please contact the facility manager to schedule a training session.
Rigaku Miniflex 600 Diffractometer I
Information the Equipment Can Provide
The MiniFlex 600 is a fast, powerful, compact benchtop x-ray diffraction system. Its capabilities include identification of crystalline phases, crystallinity, crystallite size, crystal structure determination. Sample holders for air/moisture sensitive sample are available.
Fees and Policies
- UT Users: $7/hour
- Higher Education/State Agencies: $45/hour
- Corporate/External Users: $45/hour
To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.
Rigaku Miniflex 600 Diffractometer II
Information the Equipment Can Provide
The MiniFlex 600 is a fast, powerful, compact benchtop x-ray diffraction system. Its capabilities include identification of crystalline phases, crystallinity, crystallite size, crystal structure determination. MiniFlex 600 II is equipped with an automated 6 position sample changer with sample spinning capability.
Fees and Policies
- UT Users: $7/hour
- Higher Education/State Agencies: $45/hour
- Corporate/External Users: $45/hour
To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.
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Texas Materials Seminar Series
The Texas Materials Seminar Series features MSE 397 Seminars, TMI Distinguished Lectureships, and TMI Special Seminars, where leading faculty and professionals from around the world share cutting-edge innovations and advancements in materials engineering with our students.
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$12M+
In Grant Funding
20+
Research Patents
10K+
Sq. Ft. of Research Labs
News
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La Luce Cristallina has been featured in a recent article published in Laser Focus World. In this article, the author highlights several notable advances across the photonics industry, including the work carried out by the La Luce team.
Deji Akinwande Receives U.S. Patent for Non-Volatile Resistance Switching in Monolayer Atomic Sheets
Deji Akinwande, alongside Materials Science Ph.D. alumnus Ruijing Ge, has received a U.S. patent for a key discovery achieved at UT Austin.
Manthiram Receives Honors for Contributions to Materials Research
Professor Arumugam Manthiram has recently received several prestigious recognitions highlighting his impact at the intersection of materials science and artificial intelligence.
Can ToF‑SIMS deliver standardless quantitative analysis when reference materials aren’t available?
Mangolini’s group has pioneered the first demonstration of absolute hydrogen quantification in polymers using ToF‑SIMS, without standards or sensitivity factors. The approach, called the Full Spectrum Method (FSM), moves beyond relying on a handful of “marker” secondary-ion fragments. Instead, FSM sums the intensities of all detected secondary ions that contain the element(s) of interest, helping to reduce matrix effects that can distort absolute quantification.
Alumni & Current Students of MS&E Program Lead on Collaborative Paper Showcasing New Way to Enhance Hydrogen Fuel Cells
Materials Science & Engineering alum Shanmukh Kutagulla and current student Patrick Carmichael are the lead authors on a new collaborative paper, out in ACS Nano, that presents a novel solution to problems that plague hydrogen fuel cells. Commonly used as an alternative to fossil fuels, hydrogen fuel cells currently have issues with hydrogen "leaking" through the membrane, lowering the efficiency and performance.