A domain ontology for microscopy that has a special focus on Transmission Electron Microscopy, Scanning Electron Microscopy and Light Microscopy.
This ontology builds on CHAMEO, and extends the following branches with specialised classes for microscopy:
- characterisation processes
- sample preparation processes
- image processing processes
- measurement results
Based on DOM, specialised sub-domain ontologies for TEM and SEM are under development.
Version dependencies on imported ontologies:
| Version | EMMO | CHAMEO | Status |
|---|---|---|---|
| 0.0.1 | 1.0.0 | 1.0.0 | stable |
| 0.0.2 | 1.0.0 | 1.0.0 | stable |
| 0.5.3 | 1.0.0 | 1.0.0 | stable |
| 0.6.0-beta | 1.0.2 | 1.0.2 | development |
This ontology is released under the Creative Commons Attribution 4.0 International license (CC BY 4.0).
This work has been supported by the following projects:
- SFI PhysMet (2020-2028) that receives funding from the Research Council of Norway, project no. 309584.
- MatCHMaker (2023-2027) that receives funding from the European Unio's Horizon Europe Research and Innovation Programme, under Grant Agreement n. 101091687.